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Ft. Collins sugar beet germplasm evaluated for rhizomania and storage rot resistance in Idaho, 2013

Strausbaugh, C.A. and Panella, Leonard W. (2014) Ft. Collins sugar beet germplasm evaluated for rhizomania and storage rot resistance in Idaho, 2013. Plant Disease Management Reports. 8:FC247.

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Rhizomania caused by the Beet necrotic yellow vein virus (BNYVV) is a worldwide problem that can lead to loss of tonnage and lower percent sucrose in the field. BNYVV can also reduce the storability of roots. To identify germplasm with resistance to these problems, 50 sugar beet germplasm lines developed by the USDA-ARS Ft. Collins sugar beet program and four check cultivars were screened in a field experiment arranged in a randomized complete block design with six replications. During the growing season, plants were evaluated for foliar rhizomania symptoms. At harvest on 7 October 2013, roots were evaluated for rhizomania symptoms and then placed into an indoor commercial sugar beet storage building in Paul, ID. Foliar symptoms ranged from 0% for resistant entries and checks to 98% for the susceptible entries, indicating good separation of germplasm for BNYVV resistance should have been possible in the field study. BNYVV root ratings ranged from a low of 16 for a resistant entry to a high of 33 for one of the susceptible entries at harvest. Fungal growth on the root surface in storage ranged from a low of 1% for an entry with good storability to a high of 70% for the BNYVV susceptible check. Entries 28, 30, and 33 performed well for all variables. Incorporating better resistance to BNYVV and good storability into commercial sugar beet cultivars should allow for increased yields in the field and improved recovery of sucrose from roots in storage.

Item Type: Article
NWISRL Publication Number: 1505
Subjects: Irrigated crops > Sugarbeet
Depositing User: Users 6 not found.
Date Deposited: 02 Sep 2014 18:39
Last Modified: 02 Sep 2014 18:40
Item ID: 1549